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Extraction of Secrets from 40nm CMOS Gate Dielectric Breakdown Antifuses
(
arxiv.org
)
5 points
by
fanf2
28 days ago
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1 comment
basementcat
28 days ago
[–]
They essentially use a focused ion beam to determine the contents of an antifuse programmed memory.
https://en.m.wikipedia.org/wiki/Focused_ion_beam
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Search:
https://en.m.wikipedia.org/wiki/Focused_ion_beam